Miura Yukiya | Tokyo Metropolitan University
スポンサーリンク
概要
関連著者
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Kawano K
Okayama Univ. Okayama‐shi Jpn
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Kawano K
Information Technology Center Okayama University
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Kinoshita K
Department Of Information Networking Graduate School Of Information Science And Technology Osaka Uni
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Kinoshita Kozo
Osaka Gakuin University
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Miura Yukiya
Tokyo Metropolitan University
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Miura Yukiya
Graduate Course Of Electrical Engineering Tokyo Metropolitan University
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KESHK Arabi
Osaka University
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KESHK ARABI
Graduate school of Engineering, Osaka University
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KINOSHITA KOZO
Graduate school of Engineering, Osaka University
著作論文
- Analysis of I_ Occurrence in Testing
- A Unified Procedure to Overcome the Byzantine General's Problem for Inter-gate and Intra-gate Bridging Faults in CMOS Circuits (特集 電子システムの設計技術と設計自動化)