Fung S | Physics Department The University Of Hong Kong
スポンサーリンク
概要
Physics Department The University Of Hong Kong | 論文
- Post-Breakdown Conduction Instability of Ultrathin SiO_2 Films Observed in Ramped-Current and Ramped-Voltage Current-Voltage Measurements
- Modeling the Post-Breakdown I-V Characteristics of Ultrathin SiO_2 Films With Multiple Snapbacks : Semiconductors