Hosokawa Toshinori | Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.:design
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概要
- HOSOKAWA Toshinoriの詳細を見る
- 同名の論文著者
- Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.:design の論文著者
関連著者
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HOSOKAWA Toshinori
Corporate Development Division, Semiconductor Company, Matsushita Electric Industrial Co., Ltd.
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OHTA Mitsuyasu
Corporate Development Division, Semiconductor Company, Matsushita Electric Industrial Co., Ltd.
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Hosokawa Toshinori
Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.:design
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Yoshimura Masayoshi
Second Department Of Internal Medicine Kansai Medical University
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Yoshimura Masayoshi
Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Ohta M
Tokyo Metropolitan Univ. Hachioji‐shi Jpn
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Ohta M
Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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HIRAOKA Toshihiro
Corporate Semiconductor Development Division, Matsushita Electric Industrial Co., Ltd.
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MURAOKA Michiaki
Corporate Semiconductor Development Division, Matsushita Electric Industrial Co., Ltd.
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KUNINOBU Shigeo
Corporate Semiconductor Development Division, Matsushita Electric Industrial Co., Ltd.
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Hosokawa Toshinori
Corporate Semiconductor Development Division Matsushita Electric Industrial Co. Ltd.
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Muraoka Michiaki
Corporate Semiconductor Development Division Matsushita Electric Industrial Co. Ltd.
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Hiraoka Toshihiro
Corporate Semiconductor Development Division Matsushita Electric Industrial Co. Ltd.
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Kuninobu Shigeo
Corporate Semiconductor Development Division Matsushita Electric Industrial Co. Ltd.
著作論文
- Novel DFT Strategies Using Full/Partial Scan Designs and Test Point Insertion to Reduce Test Application Time(Special Section on VLSI Design and CAD Algorithms)
- Partial Scan Design Methods Based on n-Fold Line-Up Structures and the State Justification of Pure Load/Hold Flip-Flops(Special Issue on Test and Diagnosis of VLSI)