Minami Takaaki | The Semiconductor Device Engineering Laboratory Toshiba Corporation

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概要

• Minami Takaakiの詳細を見る
• 同名の論文著者
• The Semiconductor Device Engineering Laboratory Toshiba Corporationの論文著者

関連著者

• Minami Takaaki

  The Semiconductor Device Engineering Laboratory Toshiba Corporation

• Watanabe Shigeyoshi

  The Ulsi Research Center Toshiba Corporation

著作論文

• Estimation of Yield Suppression for 1.5 V-1 Gbit DRAMs Caused by Threshold Voltage Variation of MOSFET due to Microscopic Fluctuation in Dopant Distributions

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