Yasuami S | Ulsi Research Center Toshiba Corporation

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• 同名の論文著者
• Ulsi Research Center Toshiba Corporationの論文著者

Ulsi Research Center Toshiba Corporation | 論文

• Two Correlated Mechanisms in Thin SiO_2 Breakdown
• Reliability of Structurally Modified Ultra-Thin Gate Oxides
• Observation of Oxide Thickness Dependent Interface Roughness in Si MOS Structure
• Existence of Double-Charged Oxide Traps in Submicron MOSFET's (SOLID STATE DEVICES AND MATERIALS 1)
• Coulomb Blockade Effects in Edge Quantum Wire SOI MOSFETs

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