Saravanan Shanmugam | Research Center For Micro-structure Devices Nagoya Institute Of Technology
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概要
Research Center For Micro-structure Devices Nagoya Institute Of Technology | 論文
- Optical Absorption and Electrical Conductivity of Amorphous Carbon Thin Films from Camphor : A Natural Source
- Mechanical Property Characterization of Boron-Doped Silicon by Berkovich-Type Indenter : Semiconductors
- Polarized Reflectance Spectroscopy and Spectroscopic Ellipsomentry Determination of the Optical Anisotropy of Gallium nitride on Sapphire
- Effect of NaOCl-Polishing on Metal Organic Chemical Vapor Deposition grown GaAs Surface on Si Substrate by Spectroscopic Ellipsometry and Atomic Force Microscopy
- Light Emission from Si-Metal-Oxide-Semiconductor Tunnel Junctions