KIM Daehee | Division of Electrical Engineering, Department of Electrical Engineering and Computer Science, Korea

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概要

関連著者

Kim Taeil
Samsung Advanced Institute Of Technology Materials And Devices Research Center
Kim Taeho
Division Of Electrical Engineering Department Of Electrical Engineering And Computer Science Korea A
YANG Kyounghoon
Division of Electrical Engineering, Dept. of Electrical Engineering and Computer Science (EECS), Kor
YOON Myounghoon
Division of Electrical Engineering, Department of Electrical Engineering and Computer Science, Korea
KIM Daehee
Division of Electrical Engineering, Department of Electrical Engineering and Computer Science, Korea

著作論文

Effects of Thermal Stress on the Performance of Benzocyclobutene-Passivated In_Al_As/In_Ga_As High Electron Mobility Transistors

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