OKANO Tetsuyuki | Characterization Technology Group, Matsushita Technoresearch, Inc.

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概要

• OKANO Tetsuyukiの詳細を見る
• 同名の論文著者
• Characterization Technology Group, Matsushita Technoresearch, Inc.の論文著者

関連著者

• Yamamoto Yoh

  R&d Department Sii Nanotechnology Inc.

• Yabuuchi Yasufumi

  Characterization Technology Group Matsushita Technoresearch Inc.

• Yabuuchi Yasufumi

  Characterization Technology Group Matsushita Technoresearch Inc

• INAZATO Sachiko

  Characterization Technology Group, Matsushita Technoresearch, Inc

• TAMETOU Sayoko

  Characterization Technology Group, Matsushita Technoresearch, Inc.

• OKANO Tetsuyuki

  Characterization Technology Group, Matsushita Technoresearch, Inc.

• SADAYAMA Shoji

  R&D Department, SII NanoTechnology, Inc.

• YAMAMOTO Yoh

  R&D Department, SII NanoTechnology, Inc.

• IWASAKI Koji

  R&D Department, SII NanoTechnology, Inc.

• SUGIYAMA Yasuhiko

  R&D Department, SII NanoTechnology, Inc.

• Iwasaki Koji

  R&d Department Sii Nanotechnology Inc.

• Tametou Sayoko

  Characterization Technology Group Matsushita Technoresearch Inc.

• Sadayama Shoji

  R&d Department Sii Nanotechnology Inc.

• Okano Tetsuyuki

  Characterization Technology Group Matsushita Technoresearch Inc.

• Inazato Sachiko

  Characterization Technology Group Matsushita Technoresearch Inc.

• Inazato Sachiko

  Characterization Technology Group Matsushita Technoresearch Inc

• Sugiyama Yasuhiko

  R&d Department Sii Nanotechnology Inc.

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著作論文

• A study of the damage on FIB-prepared TEM samples of Al_xGa_As

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