BHAT M. | Microelectronics Research Center Department of Electrical & Computer Engineering and Materials Scien

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概要

関連著者

Kwong D.
Microelectronics Research Center Department Of Electrical & Computer Engineering And Materials S
HAN L.
Microelectronics Research Center, Department of Electrical and Computer Engineering University of Te
MIN B.
Microelectronics Research Center Department of Electrical & Computer Engineering and Materials Scien
BHAT M.
Microelectronics Research Center Department of Electrical & Computer Engineering and Materials Scien
CHO T.
Microelectronics Research Center Department of Electrical & Computer Engineering and Materials Scien
JOSHI A.
Rockwell Telecommunications
MANN R.
Rockwell Telecommunications
CHUNG L.
Rockwell Telecommunications

著作論文

Superior Immunity to the Effects of Plasma-Induced Charging Damage on the Hot-Carrier Reliability of MOSFET's with NO-nitrided SiO_2 Gate Dielectrics

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