KADOTA Yasushi | Research and Development Center, RICOH Co. Ltd.

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概要

関連著者

Fukuda Hiroaki
Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology:research
OHTSU Motoichi
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
Ohtsu M
Department Of Electrical Engineering And Information Systems School Of Engineering The University Of
Ohtsu Motoichi
Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology
KADOTA Yasushi
Research and Development Center, RICOH Co. Ltd.
Kadota Yasushi
Research And Development Center Ricoh Co. Ltd.

著作論文

Estimation of the Minority Carrier Diffusion Length by Near-Field Photocurrent Measurement of p-n Junction in Silicon using Multiwavelength Excitation

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