Seo Hyung-Kee | School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk Nat
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概要
- 同名の論文著者
- School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk Natの論文著者
関連著者
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SHIM Kyu-Hwan
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chon
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Kang Nam-ju
Auk
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Suh Eun-kyung
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center Chonbuk Natio
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Shim Kyu-hwan
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center Chonbuk Natio
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Shim Kyu-hwan
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Choi A-Ram
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk Nat
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Choi Sang-Sik
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk Nat
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Park Byung-Guan
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk Nat
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Choi Sang-sik
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center Chonbuk Natio
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CHO Hoon
Department of Physics, Dongguk University
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Cho Hoon
Department Of Physics Dongguk University
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Choi A-ram
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center Chonbuk Natio
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Park Byung-guan
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center Chonbuk Natio
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Seo Hyung-Kee
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk Nat
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Seo Hyung-kee
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center Chonbuk Natio
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Shim Kyu-Hwan
School of Semiconductor and Chemical Engineering and Semiconductor Physics Research Center, Chonbuk National University, Jeonju 561-756, Korea
著作論文
- Influence of Pt-related deep traps formed in rectifier junctions on high-speed and Low-leakage properties (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Influence of Pt-related deep traps formed in rectifier junctions on high-speed and Low-leakage properties (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))