Yamaji Mitsuru | Department Of Electronic Engineering Osaka University

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概要

• 同名の論文著者
• Department Of Electronic Engineering Osaka Universityの論文著者

関連著者

• Hamaguchi Chihiro

  Deparimsnt Of Elecironics Facully Of Engineering Osaka University

• Yamaji Mitsuru

  Department Of Electronic Engineering Osaka University

• SONODA Ken-ichiro

  Department of Electronic Engineering, Osaka University

• Taniguchi Kenji

  Department Of Biotechnology Tottori University

• TANIGUCHI Kenji

  Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co

• Hamaguchi Chihiro

  Department Of Electronic Engineering Faculty Of Engineering Osaka University

• Hamaguchi Chihiro

  Department Of Electronic Engineering Osaka University

• Sukegawa Kazuo

  Ulsi R&ampd Division Fujitsu Limited

• DUNHAM Scott

  Department of Electrical, Computer, and Systems Engineering, Boston University

• YAMAJI Mitsuru

  Department of Electronic Engineering, Osaka University

• Yamaji M

  Department Of Electronic Engineering Osaka University

• Tanigushi Kenji

  Department of Electronic Engineering, Osaka University

• Kawamura Seiichiro

  ULSI R&D Division, FUJITSU LIMITED

• Sonoda K

  Department Of Electronic Engineering Osaka University

• Tanigushi Kenji

  Department Of Electronic Engineering Osaka University

• Kawamura S

  Ulsi R&ampd Division Fujitsu Limited

• Sonoda Ken-ichiro

  Department of Electronic Engineering, Osaka University, Yamada-oka, Suita, Osaka 565, Japan

• Dunham Scott

  Department of Electrical, Computer, and Systems Engineering, Boston University,

• Kawamura Seiichiro

  ULSI R&ampD Division, FUJITSU LIMITED

• Taniguchi Kenji

  Department of Electronic Engineering, Osaka University, Yamada-oka, Suita, Osaka 565, Japan

• Yamaji Mitsuru

  Department of Electronic Engineering, Osaka University, Yamada-oka, Suita, Osaka 565, Japan

• Hamaguchi Chihiro

  Department of Electronic Engineering, Osaka University, Yamada-oka, Suita, Osaka 565, Japan

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著作論文

• Novel Impact Ionization Model for Device Simulation Using Generalized Moment Conservation Equations
• Degradation Mechanisms of Thin Film SIMOX SOI-MOSFET Characteristics : Optical and Electrical Evaluation (Special Issue on Quarter Micron Si Device and Process Technologies)
• Impact Ionization Model Using Average Energy and Average Square Energy of Distribution Function

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