Lee Y‐j | Korea Advanced Inst. Sci. And Technol. Taejon Kor
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概要
関連著者
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Lee Y‐j
Korea Advanced Inst. Sci. And Technol. Taejon Kor
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Oh Yong-chul
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim Dong-hyun
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim Doo-young
School Of Electrical Eng. Seoul National Univ.
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Kwon Y‐s
Korea Advanced Inst. Sci. And Technol. Taejon Kor
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Kwon Young-Se
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology
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Kim C‐t
Goldstar Central Res. Lab. Seoul Kor
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Kim J‐y
Pohang Univ. Sci. And Technol. Kyungbuk Kor
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Nam In-ho
Td Team R&d Center Samsung Electronics Co.ltd.
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Kwon Young-se
Department Of E.e. Kaist
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Jang Se-myeong
Td Team R&d Center Samsung Electronics Co.ltd.
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Lee Y‐j
Optel Semiconductor Corp. Jeonbuk Kor
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Man Yoon-jae
Td Team R&d Center Samsung Electronics Co.ltd.
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Lee Sang-hyun
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim Jin-Yang
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Hyun Kyu-Taek
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Seo Hyoung-Woen
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Won Dae-Joong
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Jeong Moon-Mo
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Lee Yun-Jae
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Sun Ho-Won
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Lee Chang-Huhn
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Kim Hyun-Chang
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Kim Chang-Kyu
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Yoshida Makoto
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Jin Gyo-Yong
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Lee Won-Seong
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Jeong Moon-mo
Td Team R&d Center Samsung Electronics Co.ltd.
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Lee W‐s
名古屋大 大学院工学研究科
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Kim D‐h
College Of Pharmacy Kyung-hee University
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Lee Won-seong
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim D‐h
Department Of Psychiatry College Of Medicine Institute Of Natural Medicine Hallym University
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Kim J‐y
Department Of Materials Engineering Hanyang University
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Kim Jin-yang
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim Hyun-chang
Td Team R&d Center Samsung Electronics Co.ltd.
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Jin Gyo-yong
Td Team R&d Center Samsung Electronics Co.ltd.
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Hyun Kyu-taek
Td Team R&d Center Samsung Electronics Co.ltd.
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Won Dae-joong
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim Chang-kyu
Td Team R&d Center Samsung Electronics Co.ltd.
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Lee Chang-huhn
Td Team R&d Center Samsung Electronics Co.ltd.
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Seo Hyoung-woen
Td Team R&d Center Samsung Electronics Co.ltd.
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Lee Yun-jae
Td Team R&d Center Samsung Electronics Co.ltd.
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Yoshida Makoto
Td Team R&d Center Samsung Electronics Co.ltd.
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Yoon Hee-koo
Semiconductor R&d Lab.1 Hyundai Electronics Industries Co. Ltd.
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Yoon Hee-koo
Semiconductor R & D Lab.1 Hyundai Electronics Industries Co. Ltd.
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Yoon H‐k
Korea Advanced Inst. Of Sci. And Technol. Daejon Kor
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Yang W
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Yang W-
TD Team, R&D Center, Samsung Electronics Co.Ltd.
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Hong Song-cheol
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Lee Yoon-Jong
Semiconductor R&D Lab.1, Hyundai Electronics Industries Co., Ltd.
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Kim Chang-Tae
Central Research Lab. Goldstar Co., Ltd.
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Oh Kye-Whan
Semiconductor R&D Lab.1, Hyundai Electronics Industries Co., Ltd.
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KIM Chang-Tae
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology
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LEE Yoon-Jong
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology
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Oh Kye-whan
Semiconductor R&d Lab.1 Hyundai Electronics Industries Co. Ltd.
著作論文
- Effects of WSi_X-Polycide Gate Processes on MOSFET Reliability and Characteristics
- Effects of WSi_X-Polycide Gate Processes on MOSFET Reliability and Characteristics
- Numerical Simulation on the Device Structure of GaAs Floated Electron Channel Field-Effect Transistor
- A GaAs Junction-Gate FECFET(J-FECFET) for the Digital Integrated Circuits