KISHINO Seigo | Himeji Institute of Technology
スポンサーリンク
概要
関連著者
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Tajima Michio
Institute Of Space And Astronautical Scienc
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IBUKA Shigeo
Institute of Space and Astronautical Science
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YOSHIDA Haruhiko
Himeji Institute of Technology
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KISHINO Seigo
Himeji Institute of Technology
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TAJIMA Michio
Institute of Space and Astronautical Science/JAXA
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Yoshida H
Himeji Institute Of Technology
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Yoshida Haruhiko
Himeji Institute of Technology, 2167 Shosha, Himeji 671-2201, Japan
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Kishino Seigo
Himeji Institute of Technology, 2167 Shosha, Himeji 671-2201, Japan
著作論文
- Correlation between Photoluminescence Lifetime and Interface Trap Density in Silicon-on-Insulator Wafers
- Correlation between Photoluminescence Lifetime and Interface Trap Density in Silicon-on-Insulator Wafers