Hirabayashi A | Fuji Electric Co. Ltd.
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概要
Fuji Electric Co. Ltd. | 論文
- Measurements of the Breakdown Voltage of the Lateral Insulated Gate Bipolar Transistor on the Silicon-on-Insulator Film with Varying Implantation Doses for the N-Buffer Layer
- Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge of the SOI High-Voltage Device and IC
- Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge(ESD) of SOI High-Voltage Device and IC
- Lateral IGBT Structure on the SOI Film with the Collector-Short Region for Improved Blocking Capability
- ミズカビ病原因菌のSaprolegniaを感染させたサケ科魚卵に対する弱アルカリ性電解水の殺菌効果