Kamimura Kiichi | Faculty Of Engineering Shinshu University
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概要
関連著者
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Kamimura Kiichi
Faculty Of Engineering Shinshu University
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Kamimura K
Faculty Of Engineering Shinshu University
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Kamimura K
Keio Univ. Yokohama Jpn
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KAMIMURA Kiichi
Faculty of Engineering, Shinshu University
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Yamakami Tomohiko
Faculty Of Engineering Shinshu University
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Onuma Y
Faculty Of Engineering Shinshu University
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Onuma Yoshiharu
Faculty Of Engineering Shinshu University
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YAMAKAMI Tomohiko
Faculty of Engineering, Shinshu University
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HAYASHIBE Rinpei
Faculty of Engineering, Shinshu University
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NAKAO Masato
Faculty of Engineering, Shinshu University
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Hayashibe R
Faculty Of Engineering Shinshu University
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Yamakami T
Faculty Of Engineering Shinshu University
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Nakao Masato
Faculty Of Engineering Shinshu University
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Hayashibe Rinpei
Faculty Of Engineering Shinshu University
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Abe Katsuya
Faculty Of Engineering Shinshu University
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Sano H
Japan Advanced Inst. Sci. And Technol. Ishikawa Jpn
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SHIOZAWA Hiroaki
Faculty of Engineering, Shinshu University
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SANO Haruki
Faculty of Engineering, Shinshu University
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KUNUGI Kazumasa
Faculty of Engineering, Shinsyu University
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KUBOTA Miki
Faculty of Engineering, Shinsyu University
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Sano H
Mitsubishi Electric Corp. Kamakura‐shi Jpn
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Sano H
Faculty Of Engineering Shinshu University
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Kubota Miki
Faculty Of Engineering Shinsyu University
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Shiozawa Hiroaki
Faculty Of Engineering Shinshu University
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Kunugi Kazumasa
Faculty Of Engineering Shinsyu University
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Yamakami Tomohiko
Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan
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Kamimura Kiichi
Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan
著作論文
- Interface State Density between Direct Nitridation Layer and SiC Estimated from Current Voltage Characteristics of MIS Schottky Diode
- Preparation of Cuprous Oxide (Cu_2O) Thin Films by Reactive DC Magnetron Sputtering(Recent Progress in Oxide Thin Films by Sputtering)
- Y-Ba-Cu-O Thin Films Formed on Alumina Ceramic Substrates Coated with Yttria Stabilized Zirconia Layer
- Effect of Series Resistance on Field Emission Current