NAKAGAWA Mine | Application Technology Department, Hitachi Science Systems, Ltd.
スポンサーリンク
概要
関連著者
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Yang Jer-ren
Institute Of Materials Science And Engineering National Taiwan University
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NAKAGAWA Mine
Application Technology Department, Hitachi Science Systems, Ltd.
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YAMADA Mitsuhiko
Application Technology Department, Hitachi Science Systems, Ltd.
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SHIOJIRI Makoto
Department of Physics, Kyoto Technical University
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HSU Jung-Tsung
Opto-Electronics and System Laboratories, Industrial Technology Research Institute
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TU Ru-Chin
Opto-Electronics and System Laboratories, Industrial Technology Research Institute
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Shiojiri M
Kyoto Institute Of Technology
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SAIJO Hiroshi
Department of Electronics and Information Science, Kyoto Institute of Technology
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Saijo Hiroshi
Department Of Electronics And Information Science Kyoto Institute Of Technology
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Hsu Jung-tsung
Opto-electronics And System Laboratories Industrial Technology Research Institute
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Tu Ru-chin
Opto-electronics & Systems Laboratories Industrial Technology Research Institute
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Shiojiri Makoto
Department Of Electronics And Information Science Kyoto
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Hsu Jung-Tsung
Opto-Electronics and Systems Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan 310, Republic of China
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Shiojiri Makoto
Department of Electronics and Information Science, Kyoto Institute of Technology, Kyoto 606-8585, Japan
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Tu Ru-Chin
Opto-Electronics and Systems Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan 310, Republic of China
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Saijo Hiroshi
Department of Electronics and Information Science, Kyoto Institute of Technology, Kyoto 606-8585, Japan
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Yang Jer-Ren
Institute of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan 106, Republic of China
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Yamada Mitsuhiko
Application Technology Department, Hitachi Science Systems, Ltd., Ibaraki 312-8504, Japan
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Nakagawa Mine
Application Technology Department, Hitachi Science Systems, Ltd., Ibaraki 312-8504, Japan
著作論文
- High-Resolution Scanning Electron Microscopy Observation of GaN/AlGaN Strained-Layer Superstructures in GaN-Based Violet Laser Diodes
- High-Resolution Scanning Electron Microscopy Observation of GaN/AlGaN Strained-Layer Superstructures in GaN-Based Violet Laser Diodes