JU Dong-Hyuk | Central Research and Development Laboratory, GoldStar Electron Company, Ltd.

スポンサーリンク

概要

関連著者

Kang Dae-gwan
Central Research And Development Laboratory Goldstar Electron Company Ltd.
Hwang Hyunsang
Central Research And Development Laboratory Goldstar Electron Company Ltd.
Goo Jung-suk
Central Research And Development Laboratory Goldstar Electron Company Ltd.
SHIN Hyungsoon
Central Research and Development Laboratory, GoldStar Electron Company, Ltd.
JU Dong-Hyuk
Central Research and Development Laboratory, GoldStar Electron Company, Ltd.
Ju Dong-hyuk
Central Research And Development Laboratory Goldstar Electron Company Ltd.
Shin Hyungsoon
Central Research And Development Laboratory Goldstar Electron Company Ltd.

著作論文

Physical Analysis for Saturation Behavior of Hot-Carrier Degradation in Lightly Doped Drain N-Channel Metal-Oxide-Semiconductor Field Effect Transistors

スポンサーリンク