Cho Sangwan | Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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概要
- 同名の論文著者
- Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uniの論文著者
関連著者
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Whang Chung-nam
Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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Noh Myungkeun
Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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Yi Yeonjin
Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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Cho Sangwan
Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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Jeong Kwangho
Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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Shin Hyun-joon
Pohang Accelerator Laboratory
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Roh Yongsuk
Institute Of Physics And Applied Physics And Atomic-scale Surface Science Research Center Yonsei Uni
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Shin Hyun-Joon
Pohang Accelerator Laboratory and Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Korea
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Whang Chung-Nam
Institute of Physics and Applied Physics and Atomic-scale Surface Science Research Center, Yonsei University, Seoul 120-749, Korea
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Noh Myungkeun
Institute of Physics and Applied Physics and Atomic-scale Surface Science Research Center, Yonsei University, Seoul 120-749, Korea
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Yi Yeonjin
Institute of Physics and Applied Physics and Atomic-scale Surface Science Research Center, Yonsei University, Seoul 120-749, Korea
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Jeong Kwangho
Institute of Physics and Applied Physics and Atomic-scale Surface Science Research Center, Yonsei University, Seoul 120-749, Korea
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Roh Yongsuk
Institute of physics and applied physics and Atomic-scale surface science research center, Yonsei University, Seoul 120-749, Korea
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Cho Sangwan
Institute of Physics and Applied Physics and Atomic-scale Surface Science Research Center, Yonsei University, Seoul 120-749, Korea
著作論文
- The Instability of Nitrogen Bonds in Oxygen Incorporated InN1-xOx Films
- Characterization of Surface Chemical States of a Thick Insulator: Chemical State Imaging on MgO Surface