Nishizawa J | Semiconductor Research Institute Semiconductor Research Foundation
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概要
Semiconductor Research Institute Semiconductor Research Foundation | 論文
- GaP Raman Terahertz high accuracy spectrometer and its application to detect organic and inorganic crystalline defects
- A comparative study of THz spectra
- Digital Etching of InP by Intermittent Injection of Phosphorous Precursors in Ultra-high Vacuum
- Digital Etching of (001) InP Substrate by Intermittent Injection of Tertiarybutylphosphine in Ultrahigh Vacuum
- Digital Etching of InP Using Tris-Dimethylaminophosphorus in Ultra-High Vacuum