ROBERT Philippe | Metrology Laboratory, EPFL Swiss-Federal Institute of Technology

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概要

関連著者

Meyer Thomas
Metrology Laboratory Epfl Swiss-federal Institute Of Technology
NICATI Pierre
Metrology Laboratory, EPFL Swiss-Federal Institute of Technology
ROBERT Philippe
Metrology Laboratory, EPFL Swiss-Federal Institute of Technology
VARELAS Dimitris
Applied Optics Laboratory, EPFL Swiss-Federal Institute of Technology
LIMBERGER Hans
Applied Optics Laboratory, EPFL Swiss-Federal Institute of Technology
SALATHE Rene
Applied Optics Laboratory, EPFL Swiss-Federal Institute of Technology
Salathe Rene
Applied Optics Laboratory Epfl Swiss-federal Institute Of Technology
Nicati P‐a
Metrology Laboratory Epfl Swiss-federal Institute Of Technology
Limberger Hans
Applied Optics Laboratory Epfl Swiss-federal Institute Of Technology
Robert Philippe
Metrology Laboratory Epfl Swiss-federal Institute Of Technology
Nicati Pierre
Metrology Laboratory Epfl Swiss-federal Institute Of Technology
Varelas Dimitris
Applied Optics Laboratory Epfl Swiss-federal Institute Of Technology

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著作論文

Birefringence Writing and Erasing in Ultra-Low-Birefringence Fibers by Polarized Ultraviolet Side-Exposure : Origin and Applications

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