Shiojima Kenji | Department Of Electrical Engineering Tokyo Metropolitan University
スポンサーリンク
概要
関連著者
-
OKUMURA Tsugunori
Department of Electronics and Information Engineering, Tokyo Metropolitan University
-
Shiojima Kenji
Department Of Electrical Engineering Tokyo Metropolitan University
-
Okumura Tsugunori
Department Of Electrical And Electronic Engineering Graduate School Of Science And Engineering Tokyo
-
Shiojima K
Department Of Electrical Engineering Tokyo Metropolitan University
-
Okumura Tsugunori
Department Of Electrical Engineering Tokyo Metropolitan University
著作論文
- Scanning Internal-Photoemission Microscopy : New Mapping Technique to Characterize Electrical Inhomogeneity of Metal-Semiconductor Interface
- Improvement in Spatial Resolution of Infrared Scanning Internal-Photoemission Microscope