Fukuda Y | Tsukuba Research And Development Center Texas Instruments Japan Limited
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概要
- FUKUDA Yasuakiの詳細を見る
- 同名の論文著者
- Tsukuba Research And Development Center Texas Instruments Japan Limitedの論文著者
Tsukuba Research And Development Center Texas Instruments Japan Limited | 論文
- X-Ray Standing Wave Analysis of GaAs/Si Interface
- X-Ray Standing Wave Analysis of Al/GaAs/Si(111)
- Double-Pass Amplification in Ge Soft X-Ray Laser with a Polarizing Half-Cavity
- Generation of Misfit Dislocations in Si_Ge_x/Si Heterostructures
- Dislocation Reduction in MBE-Grown Ge on Si (001) by in situ Thermal Annealing : Condensed Matter