Mitsumata Chiharu | Advanced Electronics Research Laboratory Hitachi Metals Ltd.
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概要
関連著者
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Mitsumata Chiharu
Advanced Electronics Research Laboratory Hitachi Metals Ltd.
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SAKUMA Akimasa
Department of Applied Physics, Graduate School of Engineering, Tohoku University
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Fukamichi Kazuaki
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Sakuma Akimasa
Department Of Applied Physics Tohoku University
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Sakuma Akimasa
Tohoku Univ. Sendai Jpn
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Sakuma Akimasa
Department Of Applied Physics Graduate School Of Engineering Tohoku University
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FUKAMICHI Kazuaki
Institute for Materials Research,Tohoku University
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Fukamichi Kazuaki
Institute For Materials Research Tohoku University
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TSUNODA Masakiyo
Department of Electronic Engineering, Tohoku University
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Tsunoda Masakiyo
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Umetsu Rie
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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FUKAMICHI Kazuaki
Department of Materials Science,Faculty of Engineering,Tohoku University
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TAKAHASHI Migaku
Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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SAKUMA Akimasa
Deptartment of Applied Physics, Graduate School of Engineering, Tohoku University
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Umetsu Rie
Department of Materials Science, Graduate School of Engineering, Tohoku University
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Fukamichi Kazuaki
Department Of Aterials Science Graduate School Of Engineering Tohoku University
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ISHII Osamu
Graduate School of Engineering, Yamagata University
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Takahashi Migaku
Department Of Electronic Engineering Tohoku University
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Takahashi Migaku
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Yasuyuki Okada
Advanced Electronics Research Laboratory, Hitachi Metals, Ltd., Kumagaya, Saitama 360-0843, Japan
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Chiharu Mitsumata
Advanced Electronics Research Laboratory, Hitachi Metals, Ltd., Kumagaya, Saitama 360-0843, Japan
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Okada Yasuyuki
Advanced Electronics Research Laboratory, Hitachi Metals, Ltd., Kumagaya, Saitama 360-0843, Japan
著作論文
- Critical Thickness of Antiferromagnetic Layer in Exchange Biasing Bilayer System(Condensed matter: structure and mechanical and thermal properties)
- Exchange Bias of Antiferromagnetic/Ferromagnetic Bilayer with Cubic Anisotropy in Antiferromagnetic Layer(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Uncompensated Spin Elements in Ferromagnetic and Antiferromagnetic Bilayer with Non-Collinear Spin Structure
- Magnetic and Electrical Properties, and Mechanism of Exchange Bias-field of γ-phase and Ll_0-type Antiferromagnetic Mn Alloys
- Design of Element Configuration on Magnetic Rotation Angle Sensor with Spin-Valve Film