Lee K.j. | Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech.
スポンサーリンク
概要
関連著者
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Lee K.j.
Dept. Of Material Sci. & Eng. Korea Advanced Inst. Of Sci. & Tech.
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Lee K.j.
Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech.
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Lee T.d.
Dept. Of Material Sci. & Eng. Korea Advanced Inst. Of Sci. & Tech.
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Lee T.D.
Dept.of Materials Science and Engineering
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Lee K
Storage Lab.samsung Advanced Institute Of Technology
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Lee T
Kaist
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Kim S.h.
Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech.
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Lee S.
Samsung Electro-Mechanics Co., Ltd.
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Shin K.H.
Div. of Metals, Korea Inst of Sci. & Tech
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Kim S
Photonics Research Center Korea Institute Of Science And Technology
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Kim Sun
Photonics Research Center Korea Institute Of Science And Technology
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Kim S.
Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech. Seoul
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Lee K.
Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech. Seoul
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Lee T
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Lee T.
Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech. Seoul
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Shin K
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Shin K.
Div. Of Metals Korea Inst. Of Sci. & Tech. Seoul 136-791 Korea
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Shin K.
Dept. Of Multimedia Engineering Kyungsung University
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Kim S.
Dept. Advanced Mater. Eng., Korea Advanced Inst. of Sci. & Tech.
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Lee T.
Dept. Advanced Mater. Eng., Korea Advanced Inst. of Sci. & Tech.
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Shin K.
Dept. Advanced Mater. Eng., Korea Advanced Inst. of Sci. & Tech.
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Lee K.
Dept. Advanced Mater. Eng., Korea Advanced Inst. of Sci. & Tech.
著作論文
- Effects of MR heights on MR response of a shielded MR head with abutted permanent magnet films
- Effects of MR heights on MR response of a shielded MR head with abutted permanent magnet films
- Effects of voids in MR layer and SAL on MR response of a SAL biased MR head
- Effects of substrate bias voltage on properties of CoCrTa/Cr media
- Effect of a flash Cr interlayer on properties of CoCrTa/Cr media
- Effects of voids in MR layer and SAL on MR response of a SAL biased MR head