Honda Yoshiaki | Central Research Laboratory Hitachi Ltd.
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概要
Central Research Laboratory Hitachi Ltd. | 論文
- Morphological Evolution of the InGaN-Based Quantum Well Surface due to a Reduced Density of Threading Dislocations in the Underlying GaN through Higher Growth Pressure
- Optical Properties of GaN Thin Films on Sapphire Substrates Characterized by Variable-Angle Spectroscopic Ellipsometry
- Increased Size of Open Hexagonally Shaped Pits due to Growth Interruption and Its Influence on InGaN/GaN Quantum-Well Structures Grown by Metalorganic Vapor Phase Epitaxy
- C-10-3 Zero-Offset Low-Knee-Voltage GaINP/GaAs Collector-up Tunneling-Collector HBT
- Amplified Spontaneous Enission Measurement of GaInNAs Laser Wafers With and without Rapid Thermal Annealing