Lee Young-jong | Td Team R&d Center Samsung Electronics Co.ltd.
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概要
Td Team R&d Center Samsung Electronics Co.ltd. | 論文
- Effects of WSi_X-Polycide Gate Processes on MOSFET Reliability and Characteristics
- Effects of WSi_X-Polycide Gate Processes on MOSFET Reliability and Characteristics
- Invited Effects of WSix-Polycide Gate Processes on MOSFET Reliability and Characteristics (2001 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices(AWAD 2001))
- Hwanggunchungyitang Prevents Cadmium-Induced Ototoxicity through Suppression of the Activation of Caspase-9 and Extracellular Signal-Related Kinase in Auditory HEI-OC1 Cells(Pharmacology)
- Serotonin Depletion Enhances the Intracerebroventricularly Administered MK-801-Induced Plasma Interleukin-6 Levels in Mice