Xiao Fengchao | Univ. Electro‐communications Chofu‐shi Jpn
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概要
関連著者
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Xiao Fengchao
Univ. Electro‐communications Chofu‐shi Jpn
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Kami Yoshio
Univ. Electro‐communications Chofu‐shi Jpn
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Xiao Fengchao
Department of Information and Communication Engineering, University of Electro-Communications
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Xiao Fengchao
Department Of Information And Communication Engineering University Of Electro-communications
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Kami Yoshio
Department of Information and Communication Engineering, University of Electro-Communications
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Kami Yoshio
Department Of Communications And Systems Engineering Of University Of Electro-communications
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MURANO Kimitoshi
Department of Electrical and Electronic Engineering, Tokai University
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Murano Kimitoshi
Department Of Electrical And Electronic Engineering Tokai University
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Park Dong
Department Of Radio Science And Engineering Chungnam National University
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Park Sang
Department Of Information And Communication Engineering University Of Electro-communications
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MURANO Kimitoshi
School of Information Science and Technology, Tokai University
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Tayarani Majid
Electrical Engineering Department Iran University Of Science & Technology
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PARK Sang
Department of Interaction Design. Graduate School of Techno Design. Kookmin University
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PARK Sang
University of Electro-Communications
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XIAO Fengchao
University of Electro-Communications
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PARK Dong
Chungnum National University
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KAMI Yoshio
University of Electro-Communications
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Park Sang
Department Of Anatomy Seoul National University College Of Medicine
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Park Dong
Chungnum National Univ. Kor
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Park Dong
Department Of Acupuncture & Moxibustion College Of Oriental Medicine
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Kami Yoshio
Faculty Of Electro-communications University Of Electro-communications
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XIAO Fengchao
Faculty of Electro-Communications, University of Electro-Communications
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HASHIMOTO Ryota
Department of Mental Disorder Research, National Center of Neurology and Psychiatry
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KAWAHARA Hiroko
Faculty of Electro-Communications, University of Electro-Communications
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SUGANUMA Yoshimitsu
Department of Information and Communication Engineering, University of Electro-Communications
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Hashimoto Ryota
Department Of Information And Communication Engineering University Of Electro-communications
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Hashimoto Ryota
Department Of Electrical Engineering And Electronics Aoyama Gakuin University
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YAKABE Toshiyuki
Department of Information and Communication Engineering, University of Electro-Communications
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Yakabe Toshiyuki
Department Of Information & Communication Engineering University Of Electro-communications
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Yakabe Toshiyuki
Department Of Information And Communication Engineering University Of Electro-communications
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Suganuma Yoshimitsu
Department Of Information And Communication Engineering University Of Electro-communications
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Kawahara Hiroko
Faculty Of Electro-communications University Of Electro-communications
著作論文
- B-4-3 ANALYSIS OF CROSSTALK BETWEEN MICROSTRIP LINES IN ARBITRARY DIRECTIONS ON DIFFERENT LAYERS
- Crosstalk Analysis Method for Two Bent Lines on a PCB Using a Circuit Model(Printed Circuit Board,2nd Pan-Pacific EMC Joint Meeting-PPEMC'06-)
- Crosstalk Analysis for Two Bent Lines Using Circuit Model(Electromagnetic Compatibility (EMC))
- B-4-67 COUPLING ANALYSIS FOR PARTIALLY PARALLEL LINES OF A STRAIGHT AND BENT LINES
- Analytical Solution for Two Parallel Traces on PCB in the Time Domain with Application to Hairpin Delay Lines
- Application of Rotating-EM Field to Four-Septum TEM Cell for Radiated Immunity/Susceptibility Test(Measurement and Immunity,2nd Pan-Pacific EMC Joint Meeting-PPEMC'06-)
- Time Domain Crosstalk Characteristics between Single-Ended and Differential Lines(Printed Circuit Board,2nd Pan-Pacific EMC Joint Meeting-PPEMC'06-)
- Design of a Four-Septum TEM Cell for Immunity/Susceptibility Test(Measurements, 2004 International Symposium on Electromagnetic Compatibility)
- A New Generation Method of Slowly Rotating-EM Fields for Radiated Immunity/Susceptibility Test(Measurements, 2004 International Symposium on Electromagnetic Compatibility)
- A Vector Network Analyzer Based on Seven-Port Wave-Correlator(Measuring Techniques, Recent Technologies of Microwave and Millimeter-Wave Devices Focusing on Miniaturization and Advancement in Performance with Their Applications)