Hou Yong-tian | Centre For Ic Failure Analysis & Reliability Department Of Electrical & Computer Engineering

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概要

関連著者

Li Ming-Fu
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering, National Uni
Hou Yong-tian
Centre For Ic Failure Analysis & Reliability Department Of Electrical & Computer Engineering
Li Ming-fu
Centre For Ic Failure Analysis & Reliability Department Of Electrical & Computer Engineering

著作論文

A Novel Simulation Algorithm for Si Valence Hole Quantization of Inversion Layer in Metal-Oxide-Semiconductor Devices : Semiconductors

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