Chang Wai-jyh | Department Of Electrical Engineering National Cheng-kung University
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概要
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- 同名の論文著者
- Department Of Electrical Engineering National Cheng-kung Universityの論文著者
関連著者
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Chang Wai-jyh
Department Of Electrical Engineering National Cheng-kung University
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Chang Woo-jin
Microwave Devices Team Etri
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Wang Y‐h
National Cheng‐kung Univ. Tainan Twn
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Wang Yeong-her
Department Of Electrical Engineering National Cheng Kung University
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Houng M‐p
National Cheng‐kung Univ. Tainan Twn
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Houng Mau-phon
Department Of Electrical Engineering National Cheng Kung University
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WANG Yeong-Her
Department of Electrical Engineering, National Cheng Kung University
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HOUNG Mau-Phon
Department of Electrical Engineering, National Cheng-Kung University
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Wang Na-fu
Department Of Electrical Engineering National Cheng-kung University
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Huang C‐j
Southern Taiwan Univ. Technol. Tainan Twn
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HUANG Chien-Jung
Department of Electrical Engineering, Southern Taiwan University of Technology
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Huang Chien-jung
Department Of Applied Physics National University Of Kaohsiung
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HOUNG Mau-Phon
Deprtment of Electrical Engineering, National Cheng-Kung University
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WANG Yeong-Her
Deprtment of Electrical Engineering, National Cheng-Kung University
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WANG Na-Fu
Deprtment of Electrical Engineering, National Cheng-Kung University
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HUANG Chien-Jung
Deprtment of Electrical Engineering, National Cheng-Kung University
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CHANG Wai-Jyh
Deprtment of Electrical Engineering, National Cheng-Kung University
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Wang Yeong-Her
Department of Electrical Engineering, National Cheng-Kung University, Taiwan, R.O.C.
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Houng Mau-Phon
Department of Electrical Engineering, National Cheng-Kung University, Taiwan, R.O.C.
著作論文
- Trap Concentration Dependence on the Electrical Properties of Annealed Ultrathin Fluorinated Silicon Oxides
- Fourier Transform Infrared Characterization of Moisture Absorption in SiOF Film
- Effect of Fluorine Concentration on the Metal-Insulator-Semiconductor (MIS) Solar Cell Output Performance by Liquid Phase Deposition
- Near Room-Temperature Growth of SiO_2 Films for p-HgCdTe Passivation by Liquid Phase Deposition
- Trap Concentration Dependence on the Electrical Properties of Annealed Ultrathin Fluorinated Silicon Oxides