NONAKA Hidehiko | Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Sci

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概要

関連著者

YAMAMOTO Kazuhiro
Research Center for Advanced Carbon Materials, AIST
Fujiwara Yukio
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie
TERANISHI Yoshikazu
Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Sci
KONDOU Kouji
Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Sci
NONAKA Hidehiko
Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Sci
TOMITA Misuhiro
Corporate Research and Development Center, Toshiba Corporation
FUJIMOTO Toshiyuki
Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Sci
ICHIMURA Shingo
Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Sci
Ichimura Shingo
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie
Nonaka Hidehiko
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie
Kondou Kouji
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie
Tomita Mitsuhiro
Corporate Research And Development Center Toshiba Corporation
Yamamoto Kazuhiro
Research Center For Advanced Carbon Materials Aist
Yamamoto Kazuhiro
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie
Tomita Misuhiro
Corporate Research And Development Center Toshiba Corporation
Teranishi Yoshikazu
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie
Fujimoto Toshiyuki
Research Institute Of Instrumentation Frontier (riif) National Institute Of Advanced Industrial Scie

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著作論文

Observation of Sputtered Si Surface Irradiated with Metal Cluster Complex Ions

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