YEH C | Central R & D Division, United Microelectronics Corp.
スポンサーリンク
概要
関連著者
-
Chen David
Central R & D Division United Microelectronics Corp.
-
YEH C
Central R & D Division, United Microelectronics Corp.
-
CHIEN S
Central R & D Division, United Microelectronics Corp.
-
Tang Mao-chyuan
Central R & D Division United Microelectronics Corp.
-
Yeh C
Central R & D Division United Microelectronics Corp.
-
Chien S
Central R & D Division United Microelectronics Corp.
-
FANG Yean-Kuen
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, Nat
-
Fang Yean-kuen
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
-
TANG Mao-Chyuan
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, Nat
-
TANG Mao-Chyuan
Central R & D Division, United Microelectronics Corp.
-
WANG Meng-Feng
Central R & D Division, United Microelectronics Corp.
-
CHENG Tim
Central R & D Division, United Microelectronics Corp.
-
Wang Meng-feng
Central R & D Division United Microelectronics Corp.
-
Tang Mao-chyuan
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
-
Fang Yean-kuen
Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering Nation
著作論文
- Effects of hot carriers on DC and RF performances of deep submicron PMOSFET for low-power and high frequency applications
- Non-destructive extraction of width bias variations for deep sub-micron interconnect lines