Oda Tatsuki | Department Of Computational Science Kanazawa University
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概要
Department Of Computational Science Kanazawa University | 論文
- Repulsion-mediated step wandering on a Si(001)vicinal face
- OS4(P)-8(OS04W0091) A Comparison of X-ray Stress Measurement Methods for TiN Thin Films Having Fiber Texture near Single Crystal Structure
- X-Ray Stress Measurement for -Oriented TiC Films
- Effect of two-dimensionality on step bunching on a Si(001) vicinal face
- Growth of step bunches on a Si(001) vicinal face with drift of adatoms