IWATA Kakuya | National Institute of Advanced Industrial and Science Technology
スポンサーリンク
概要
関連著者
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YAMADA Akimasa
National Institute of Advanced Industrial and Science Technology
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FONS Paul
National Institute of Advanced Industrial and Science Technology
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SAKURAI Keiichiro
National Institute of Advanced Industrial and Science Technology
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MATSUBARA Koji
National Institute of Advanced Industrial and Science Technology
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IWATA Kakuya
National Institute of Advanced Industrial and Science Technology
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NIKI Shigeru
National Institute of Advanced Industrial and Science Technology
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Yamada Akira
Frontier Research Program The Institute Of Physical And Chemical Research (riken)
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Fons P
Optoelectronic Materials And Devices Group Photonics Research Institute National Institute Of Advanc
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Fons P
National Inst. Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Fons Paul
Optoelectronic Materials And Devices Group Photonics Research Institute National Institute Of Advanc
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Iwata K
Optoelectronic Materials And Devices Group Photonics Research Institute National Institute Of Advanc
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Fons Paul
National Institute of Advanced Industrial and Science Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Yamada Akimasa
National Institute of Advanced Industrial and Science Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Niki Shigeru
National Institute of Advanced Industrial and Science Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Iwata Kakuya
National Institute of Advanced Industrial and Science Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Sakurai Keiichiro
National Institute of Advanced Industrial and Science Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
著作論文
- Estimation and Correction Procedure for the Effects of Surface Roughness on Electron Probe Microanalysis
- Estimation and Correction Procedure for the Effects of Surface Roughness on Electron Probe Microanalysis