Fukuda Yasuhiro | Quality Assurance Center Oki Electric Industry Co. Ltd.

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概要

• Fukuda Yasuhiroの詳細を見る
• 同名の論文著者
• Quality Assurance Center Oki Electric Industry Co. Ltd.の論文著者

関連著者

• Fukuda Yasuhiro

  Quality Assurance Center Oki Electric Industry Co. Ltd.

• Kurachi Ikuo

  Process Technology Center, OKI Electric Industry Co., Ltd.

• Kurachi Ikuo

  Process Technology Center Oki Electric Industry Co. Ltd.

著作論文

• Improvement of "Soft Breakdown" Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure (Special Section on Reliability)

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