Toda Masayuki | Wacom R&d Corporation
スポンサーリンク
概要
関連著者
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Toda Masayuki
Wacom R&d Corporation
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Lu Da-yong
Research Center For Materials Science And Engineering Jilin Institute Of Chemical Technology
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Sun Xiu-yun
Research Center For Materials Science And Engineering Jilin Institute Of Chemical Technology
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LI Xue-Cui
Institute of Physics, Jilin University
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TODA Masayuki
WACOM R&D Corporation
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WANG Xue-Feng
Institute of Physics, Jilin University
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SUN Xiu-Yun
Research Center for Materials Science and Engineering, Jilin Institute of Chemical Technology
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Li Xue-cui
Institute Of Physics Jilin University
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Wang Xue-feng
Institute Of Physics Jilin University
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Onoe Atsushi
R&D Laboratories, Pioneer Corporation, 6-1-1 Fujimi, Tsurugashima, Saitama 350-2288, Japan
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Sun Xiu-Yun
Research Center for Materials Science and Engineering, Jilin Institute of Chemical Technology, Chengde Street 45, Jilin 132022, China
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Ogata Takeaki
Department of Chemistry and Chemical Engineering, Faculty of Engineering, Yamagata University, 4-3-16 Jonan, Yonezawa, Yamagata 992-8510, Japan
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Lu Da-Yong
Research Center for Materials Science and Engineering, Jilin Institute of Chemical Technology, Chengde Street 45, Jilin 132022, China
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Tamura Masahiro
AMAYA Corporation, 3149-1 Nishikata, Koshigaya, Saitama 343-0822, Japan
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Fujimoto Kenjiro
R&D Laboratories, Pioneer Corporation, 6-1-2 Fujimi, Tsurugashima, Saitama 350-2288, Japan
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Kawano Takahiro
R&D Laboratories, Pioneer Corporation, 6-1-2 Fujimi, Tsurugashima, Saitama 350-2288, Japan
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Umeda Masaru
WACOM R&D Corporation, 568 Tanaka, Fukaya, Saitama 369-1108, Japan
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Kawano Takahiro
R&D Laboratories, Pioneer Corporation, 6-1-2 Fujimi, Tsurugashima, Saitama 350-2288, Japan
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Umeda Masaru
WACOM R&D Corporation, 568 Tanaka, Fukaya, Saitama 369-1108, Japan
著作論文
- Improvement of solid solution and dielectric properties of (Ba,Sr)(Ti,Ce)O_3 ceramics by slight La doping
- Point Defect Characteristics of High-$k$ Double Rare-Earth-Doped BaTiO3 Ceramics with Diffuse Phase Transition by Electron Spin Resonance
- 1 Tbit/in.2 Very-High-Density Recording in Mass-Productive Polycrystalline Ferroelectric Thin Film Media