Ohki Hiroshi | R&d Association For Future Electron Devices
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概要
R&d Association For Future Electron Devices | 論文
- Ultra-Thin Fatigue-Free Bi_4Ti_3O_ Films for Nonvolatile Ferroelectric Memories
- Fabrication and Characterization of 1T2C-Type Ferroelectric Memory Cell with Local Interconnections
- Nondestruetive Characterization of Deep Levels in Semi-Insulating GaAs Wafers Using Microwave Impedance Measurement
- Dependence of Deep Level Concentration on Nonstoiehiometry in MOCVD GaAs
- Molecular Beam Epitaxially Grown ZnSe(001) Surface Studied by the In Situ Observation of RHEED Intensity