YUN Hyung-Joong | Jeonju Center, Korea Basic Science Institute (KBSI)
スポンサーリンク
概要
関連著者
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LEE Hoon-Ki
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chon
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CHANDRA S.
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chon
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SHIM Kyu-Hwan
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chon
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YUN Hyung-Joong
Jeonju Center, Korea Basic Science Institute (KBSI)
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LEE Jouhahn
Jeonju Center, Korea Basic Science Institute (KBSI)
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CHOI Chel-Jong
Department of BIN Fusion Technology, Chonbuk National University
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Choi Chel-jong
Department Of Bin Fusion Technology Chonbuk National University
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Lee Jouhahn
Jeonju Center Korea Basic Science Institute (kbsi)
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Lee Hoon-ki
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Yun Hyung-joong
Jeonju Center Korea Basic Science Institute (kbsi)
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Chandra S.
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Shim Kyu-Hwan
School of Semiconductor and Chemical Engineering and Semiconductor Physics Research Center, Chonbuk National University, Jeonju 561-756, Korea
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Shim Kyu-hwan
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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SHIM Kyu-Hwan
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University
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LEE Hoon-Ki
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University
著作論文
- Electrical and structural properties of metal oxide semiconductor (MOS) devices with Pt/Ta_2O_5 gate stacks(Session 7A : Gate Oxides)
- Electrical and structural properties of metal oxide semiconductor (MOS) devices with Pt/Ta_2O_5 gate stacks(Session 7A : Gate Oxides)