Kohno Eitaro | Hiroshima City University
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概要
Hiroshima City University | 論文
- Design and Optimization of Transparency-Based TAM for SoC Test
- Design and Optimization of Transparency-Based TAM for SoC Test
- A Variable-Length Coding Adjustable for Compressed Test Application
- A Practical Threshold Test Generation for Error Tolerant Application
- On the Effect of Scheduling in Test Generation