Wang Mu-Chun | Technology and Process Development Division, United Microelectronics Corp.
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概要
Technology and Process Development Division, United Microelectronics Corp. | 論文
- A Novel P-Channel Flash Electrically-Erasable Programmable Read-Only Memory (EEPROM) Cell with Oxide-Nitride-Oxide (ONO) as Split Gate Channel Dielectric
- A Novel P-Channel Flash EEPROM Cell with Simple Process and Low Power Consumption