Ikuta Hiroshi | Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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- Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japanの論文著者
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan | 論文
- Bulk Sensitive Soft X-ray Angle-Resolved Photoemission Spectroscopy of Bi1.72Pb0.38Sr1.88CuO6+δ
- Conductance Oscillations in Hopping Conduction Systems Fabricated by Focused Ion Beam Implantation ( Quantum Dot Structures)
- Effect of Pr Valence State on Interfacial Structure and Electrical Properties of Pr Oxide/PrON/Ge Gate Stack Structure
- Analysis of Local Leakage Current of Pr-Oxide Thin Films with Conductive Atomic Force Microscopy
- Structural Analysis of Si-Based Nanodot Arrays Self-Organized by Selective Etching of SiGe/Si Films