Takeda Shingo | Graduate School of Science, Himeji Inst. of Tech.
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概要
Graduate School of Science, Himeji Inst. of Tech. | 論文
- OS4(5)-19(OS04W0319) Measurement of Local Minute Strain by Using Synchrotron X-Ray Microbeam
- Evaluation of Lattice Strain in Silicon Substrate Beneath Aluminum Conductor Film Using High-Resolution X-Ray Microbeam Diffractometry
- Formation of Parallel X-Ray Microbeam and Its Application
- Phase-Contrast X-Ray Imaging Using Both Vertically and Horizontally Expanded Synchrotron Radiation X-Rays with Asymmetric Bragg Reflection
- 500-nm-Resolution 10 keV X-Ray Imaging Transmission Microscope with Tantalum Phase Zone Plates