Ohnishi Yoichi | AdvanceSoft Corporation
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概要
AdvanceSoft Corporation | 論文
- Effect of Hydrogenation on the Dangling-Bond Free 4H-SiC(1120)/SiO_2 Interface Studied by Ab Initio Calculations
- First Principles Theoretical Study of 4H-SiC/SiO_2 Interfacial Electronic States on (0001), (0001), and (1120)
- Microscopic Effect of Nitrogen Doping on Dielectric Constant of Hf-silicate
- First-Principles Calculation Software for Dielectric Response Study of High-k Materials
- Calculated Threshold Current Densityof Multi-Quantum-Well Wire Lasers