Yao Liang-Gi | Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company

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• Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Companyの論文著者

Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company | 論文

• Threshold Voltage Instability in nMOSFETs with HfSiO/SiO_2 High-k Gate Stacks
• Effects of Base Oxide and Silicon Composition on Charge Trapping in HfSiO/SiO_2 High-k Gate Stacks

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