SINGH R. | Electrical Engineering Department

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Electrical Engineering Department | 論文

• Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns(VLSI Design Technology and CAD)
• A Design for Testability Technique for Low Power Delay Fault Testing(Low-Power System LSI, IP and Related Technologies)
• Computed tomography image enhancement using the concept of fuzzy logic

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