松永 義弘 | Materials and Electronic Devices Laboratory, Mitsubishi Electric Co.
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概要
Materials and Electronic Devices Laboratory, Mitsubishi Electric Co. | 論文
- Measurement of Stress Induced Birefringence of Bi_GeO_ Single Crystals by a New Ellipsometry : A: Applications and Fundamentals
- High-temperature X-Ray Diffraction Measurements of ZnO Varistor Ceramics
- Effects of Contents of Bi_2O_3 and Sb_2O_3 on Lattice Parameters of Phases of ZnO Varistor Ceramics
- Preparation of Sr(Zr, Ti)O_3 Ceramics and Their Dielectric Properties at Microwave Frequencies
- Electric Properties of SrTiO_3 Thin Films Prepared by RF Sputtering