Kishino Seigô | Department of Electronics, Himeji Institute of Technology

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Department of Electronics, Himeji Institute of Technology | 論文

• Measurement of MOS Leakage Conductance by Means of the Lateral Photovoltaic Effect
• Lateral Photovoltaic Effect in the Weakly Inverted and in the Depleted MOS Interface Layers
• Experimental Verification of the Small-Signal Theory of the Lateral Photovoltaic Effect in MOS Structures
• Lateral Photovoltaic Measurements of Electrical Properties of SiAl:H/n-Type Si Structures
• High Conductive P-Type Films of Si_Al_x:H Fabricated by Co-Sputtering and Subsequent Annealing

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