Lei Tan | Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan
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- 同名の論文著者
- Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwanの論文著者
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan | 論文
- Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal–Oxide–Semiconductor Field Effect Transistors
- The Effects of Dielectric Type and Thickness on the Characteristics of Dynamic Threshold Metal Oxide Semiconductor Transistors