Lei Tan | Dept. of Electronics Engineering, National Chiao-Tung University
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概要
Dept. of Electronics Engineering, National Chiao-Tung University | 論文
- NBT Stress Induced Anomalous Drain Current Instability in HfSiON pMOSFETs Arising from Bipolar Charge Trapping
- Floating Body Accelerated Oxide Breakdown Progression in Ultra-Thin Oxide SOI pMOSFETs
- 140 Radioautographic study of nucleic acid synthesis in aging mice pancreatic acinar cells.
- Radioautographic study of nucleic acid synthesis in aging mice pancreatic acinar cells.