OSAKI M. | JEOL Co. Ltd
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概要
JEOL Co. Ltd | 論文
- Transmiccion electron microscopy study of a semiconducting SrTiO_3 ceramic condenser
- Cross-Sectional Transmission Electron Microscopy of ZnO Tetrapod-Like Particles
- High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO_2/SiO_2/Si metal-oxide-semiconductor structures
- Retrieval process of high-resolution HAADF-STEM images
- Artificial bright spots in atomic-resolution high-angle annular dark field STEM images